2MILab offers a range of instruments and other research tools covering a wide range of analytical capability for the investigation of particulate systems, material surfaces and interfaces. Some instruments recently installed, or currently under procurement include XPS, a new SEM-EDS system, a new laser for sum frequency generation spectroscopy, and a cryo-ultramicrotome for sample preparation for TEM, SEM, AFM, Raman etc. The following list covers the more important tools.

Instrument (click on link for further information)	Supplier	Model	LIMS link
Transmission electron microscope (TEM)	Hitachi	HT7700	TEM
Scanning electron microscope with energy dispersive x-ray spectroscopy (SEM-EDS)	Philips	XL-30	SEM 1
FE-Scanning electron microscope with ChemiSEM live chemical imaging (ChemiSEM)	Thermo Fisher Scientific	Apreo 2s	SEM 2
X-ray photoelectron spectroscope (XPS)	Kratos	AXIS Supra+	XPS
Atomic force microscope (AFM)	Bruker	Multimode 8	AFM
Nano infrared microscope	NeaSpec	IR-neaSCOPE	NanoIR
Femtosecond sum frequency generation (SFG)	Custom-built		FemtoSFG
Picosecond sum frequency generation (SFG)	Custom-built		PicoSFG
Total internal reflection (TIR) Raman	Custom-built		TIR-Raman
Quartz crystal microbalance with dissipation monitoring (QCM-D)	Q-Sense (Biolin Scientific)	E4	QCM-D
Quartz crystal microbalance	Attana	A100	Attana
Ellipsometer	Beaglehole	Picometer	Ellipsometer
Tensiometer	Krüss		Tensiometer
Contact angle meter	Fibro	Pocket Goniometer	Pocket
Gas adsorption for BET surface area and pore size distribution	Micromeritics	3Flex	BET
Mercury intrusion porosimetry	Micromeritics	Autopore IV	Hg-porosimeter
Dynamic light scattering	Malvern	Zetasizer Nano
Streaming potential meter	Anton Paar	SurPass 2	SurPass
Powder x-ray diffraction	PANanalytical	X’Pert Pro	XRD